Detecting Patterns of Defects in the Manufacture of Integrated Circuits

Galaxy Semiconductors Intelligence Computer Science, 2020–21

Liaison(s): Wes Smith
Advisor(s): Katherine Breeden
Students(s): Mohamed Emish, Sean Hoerger, Aditya Khant, Andrew Chen

To ensure the highest production standards, manufacturers of modern integrated circuits generate a wealth of testing data. Galaxy Semiconductor Intelligence aims to detect systematic errors by looking beyond individual devices to examine patterns in errors at the wafer level. Our team is designing algorithms to uncover evidence of such patterns, and we present results from our diagnostics in a Graphical User Interface. This tool will provide Galaxy and their clients with further insights into potential improvements for their manufacturing processes.