Extensible Data Management for Semiconductor Design-for-TestabilityJanuary 1, 2003
Teradyne, Inc. Computer Science, 2002-03
Liaison(s): Robert Varney, Gary Borsos
Advisor(s): Ran Libeskind-Hadas
Students(s): Kristal Pollack (PM), Michael Bailey, Annie Chang, Peter Tempest
Teradyne’s DFT (Design for Testability) Software Group is developing a software system which enables semiconductor manufacturers to exploit DFTtechnologies in order to reduce test costs, accelerate time to market, and enhance yield. However, to make the best use of DFT, semiconductor manufacturers must also be able to easily manage and interpret the automatically generated test results along with existing semiconductor design information and new information produced by DFT diagnosis tools. This clinic project has created a Java and XML/XSLT based system to meet this need.